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PROFILER ® 140E
Off Line Film Thickness Profiler
The Profiler can detect changes as small as
1/3,000th of a human hair or about 100 atoms in thickness. The system is
mainly used in laboratories and measures film thickness in the range of
6,4 µm -2.540 µm. The profiler offers new capabilities as high and low
spots on a blown film die are now easy to pin-point with new polar
graphics technology. Other improvements include data summary reports,
coating thickness profile for discrete layer evaluation, slope graphing
for tracking the rate of each thickness change.
Typical
Applications:
- R&D and QC/QA
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